Dr. Neculai Moisoi, Druck Principal Metrologist, presented a paper to his peers at the prestigious event, which is held only every 5 or 6 years.
The paper Dr. Moisoi presented was one of the few presented by a participant outside of National Metrology Institutes.
The CCM International Conference on Pressure and Vacuum Metrology in conjunction with the International Conference IMEKO TC16, taking place this year on May 15 to19th, 2023 while being hosted by NIST in the Washington DC area.
The CCM International Conference on Pressure and Vacuum Metrology is the world’s leading conference on measurement related issues in the pressure and vacuum field. It is to review research and developing work on highest quality primary standards and the dissemination of traceability to the most exacting and demanding users in the range from 10 ^-9 Pa to 10 ^10 Pa.
The International Conference IMEKO TC16 on pressure measurement focuses also on how to support practical pressure and vacuum metrology for industrial sectors like process and semiconductor industry, photovoltaic, coating, metallurgy, packaging, pharmaceutical and others but also for research applications.
'The CCM International Conference on Pressure and Vacuum Metrology in conjunction with the International Conference IMEKO TC16 has brought together the brightest minds in pressure and vacuum metrology' - Dr. Neculai Moisoi
Researchers from National Metrology Institutes (NMIs) and other top pressure/vacuum metrology scientists from around the world gather to share ideas and discuss topics to further advance realization and dissemination of pressure measurements at the highest level.
Dr. Moisoi, shared research comparing different methods of negative gauge pressure calibration using a PACE CM3 pressure controller.
Participants also got a sneak peek at PACE Tallis, a transfer standard developed for the most demanding pressure metrology applications.
PACE Tallis improves upon Druck TERPS technology to deliver measurement stability and accuracy surpassing even already-leading PACE performance.
After the event Dr. Moisoi, stated: “The CCM International Conference on Pressure and Vacuum Metrology in conjunction with the International Conference IMEKO TC16 has brought together the brightest minds in pressure and vacuum metrology, with many presentations covering primary and secondary standards.
My colleague, Mike Searle and I could see first-hand, how our TERPS technology can fit with the National Metrology Institutes intercomparisons activities or provide high accuracy, precision, and long-term stability to demanding industrial applications.
Our colleagues from National Metrology Institutes have expressed a lot of interest into PACE Tallis, as they are looking forward to this product launch and availability to be used in their laboratories.”