The world‘s most flexible industrial dual-tube micro/nano CT scanner
Discover the future of nondestructive testing with the all-new
Phoenix V|tome|x M Neo.
Our flagship computed tomography solution sets a new standard in flexibility, speed, and detection quality, making it the ultimate choice for a wide range of applications in various industries.
Experience the wide range of benefits the Phoenix V|tome|x M Neo has to offer
Broader sample size range at increased sample weight
Effortless, faster loading and unloading
Simplified maintenance for greater productivity and reduced downtime
Increased flexibility, speed, and detection quality
• High-performance microfocus and nanofocus tubes
• Dual tube setup with horizontal orientation improves image acquisition
• Exclusive Dynamic 41 detectors
• High Flux Target technology enabling faster scanning
- Easy to access maintenance door
- Re-engineered manipulator enabling high efficiency
- Two large sliding doors provide effortless operation
- Flexible loading via internal oder external crane
- Highly versatile control panel
- Expanded scanning area suitable for inspecting both small and large parts
- High variable focus detector distance
- Automatic defect recognition (ADR) workflows through X|approver software
- Equipped with the latest Datos|x software providing full control of your data acquisition and even faster data reconstruction
Applications
Made to meet your industry challenges
The Phoenix V|tome|x M Neo is a flexible system suitable for a wide range of 3D metrology, research, and evaluation applications in laboratory environments. Additionally, its automation capabilities make it well-suited for precise testing in production environments, providing reliable results for industrial applications.
In the aerospace industry, the Phoenix V|tome|x M Neo serves as a versatile and indispensable tool with diverse applications. It excels in inspecting and evaluating critical components such as air foils, additive manufactured parts used for spare parts and maintenance purposes, cutting-edge carbon fiber technology, and intricate electronic components for satellites.
The Phoenix V|tome|x M Neo is a powerful solution for battery testing, offering precise anode and cathode measurements, as well as failure analysis for various battery cell configurations like prismatic, pouch, folded, and stacked. Its advanced capabilities ensure the reliability and efficiency of battery technologies, contributing to their enhanced performance in various applications.
Whether it's assessing microstructures, examining solder joints, or inspecting circuit boards, the Phoenix V|tome|x M Neo provides valuable insights that contribute to enhancing product reliability, optimizing manufacturing processes, and accelerating research and development efforts in the electronics industry.
A long legacy
Building on tradition
The Phoenix V|tome|x M Neo is a next-generation industrial CT system, building on the success of the widely-used Phoenix V|tome|x platform with over a thousand installations worldwide. It offers remarkable advancements, including improved image results, an expanded scanning area for larger and heavier samples, variable focus detector distance, and a new cabinet design for enhanced flexibility and accessibility.
Advancing imaging and analysis with superior performance
300 kV / 500 W microfocus X-ray tube - specially optimized for CT applications optionally combined with a high power 180 kV/20 W nanofocus X-ray tube for highest precision scans of smaller and lower absorbing samples
Up to 10 times increased filament lifetime, ensuring long-term stability and optimizing system efficiency by Long-life|filament (optionally)
Double CT resolution at the same speed, or double throughput at the same quality level as 200 µm pitch DXR detectors. Compared to 16-bit detectors, the optimized 14-bit technology offers the highest efficiency with a dynamic range of 10000:1 and thus saves time in use and also generates less noise in the image
Scan even larger parts with up to ~70% larger scanning volume
Define a virtual scan rotation axis for ease of scan adjustment and flexible ROI CT scans
The Multi|bhc tool corrects streaking artifacts which typically occur as multiple dark streaking bands positioned between dense areas in multi-material samples
Adaptive scatter correct filter offering unrivaled image quality by significantly reducing artifacts caused by reduced grey values in high absorbing sample CT datasets
This easily removable holder allows automatic change of different samples
In combination with the Sample|changer, the optional Filter|changer allows to perform mixed batch CT scans
Fully automate your data acquisition, volume processing, and evaluation with ease
Global Industrial X-ray 2D and 3D CT Scanning Services from Waygate Technologies
